Optimized CS-corrected Imaging of Radiation-sensitive High-resolution Objects

M. Malac, Marco Beleggia, R. Egerton, Y. Zhu

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	12
Issue number	Supplement S02
Pages (from-to)	1458-1459
Number of pages	2
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927606067341
Publication status	Published - 2006
Externally published	Yes
Event	Microscopy and Microanalysis 2006 - Chicago, IL, United States Duration: 30 Jul 2005 → 3 Aug 2005

Conference	Microscopy and Microanalysis 2006
Country/Territory	United States
City	Chicago, IL
Period	30/07/2005 → 03/08/2005

Access to Document

@inproceedings{0404050ef62a472cb71d74b69b3473e4,

title = "Optimized CS-corrected Imaging of Radiation-sensitive High-resolution Objects",

author = "M. Malac and Marco Beleggia and R. Egerton and Y. Zhu",

year = "2006",

doi = "10.1017/S1431927606067341",

language = "English",

volume = "12",

pages = "1458--1459",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Supplement S02",

note = "Microscopy and Microanalysis 2006 ; Conference date: 30-07-2005 Through 03-08-2005",

}

TY - GEN

T1 - Optimized CS-corrected Imaging of Radiation-sensitive High-resolution Objects

AU - Malac, M.

AU - Beleggia, Marco

AU - Egerton, R.

AU - Zhu, Y.

PY - 2006

Y1 - 2006

U2 - 10.1017/S1431927606067341

DO - 10.1017/S1431927606067341

M3 - Conference article

VL - 12

SP - 1458

EP - 1459

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - Supplement S02

T2 - Microscopy and Microanalysis 2006

Y2 - 30 July 2005 through 3 August 2005

ER -