Optimized CS-corrected Imaging of Radiation-sensitive High-resolution Objects

M. Malac, Marco Beleggia, R. Egerton, Y. Zhu

Research output: Contribution to journalConference articleResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume12
Issue numberSupplement S02
Pages (from-to)1458-1459
Number of pages2
ISSN1431-9276
DOIs
Publication statusPublished - 2006
Externally publishedYes
EventMicroscopy and Microanalysis 2006 - Chicago, IL, United States
Duration: 30 Jul 20053 Aug 2005

Conference

ConferenceMicroscopy and Microanalysis 2006
Country/TerritoryUnited States
CityChicago, IL
Period30/07/200503/08/2005

Cite this