Optimization of multilayer coatings for future high-energy focusing telescopes

N. C. Gellert*, S. Massahi, D. D. M. Ferreira, F. E. Christensen, S. Svendsen, A. 'S Jegers, K. K. Madsen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

Nanometer-thin multilayer coatings can enable high performance of focusing X-ray telescopes to energies up to 200 keV and beyond. In this paper we discuss the multilayer parameters and their limitations necessary for the reflection of hard X-ray photons. We present several multilayer coating designs that are optimized with a Differential Evolution algorithm to perform a stochastic global search of the multi-parametric model space. The coating designs are based on the new specifications of the HEX-P mission geometry, optimizing within the energy range 60 keV - 200 keV. We compare the simulated reflectivity spectra of Si/Ni, Si/Pt and Si/W, at different incident angles. We find the effective upper limit of bilayers in the multilayer stack, beyond which reflectivity will not be increased. We discuss a hybrid multilayer coating design, consisting of either a Si/Pt or Si/W multilayer with a top Si/Ni multilayer.
Original languageEnglish
Title of host publicationProceedings of SPIE : Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
Number of pages10
Volume12181
PublisherSPIE - The International Society for Optical Engineering
Publication date2022
Article number121814K
DOIs
Publication statusPublished - 2022
EventSpace Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray - Montréal, Canada
Duration: 17 Jul 202222 Jul 2022
https://spie.org/as/conferencedetails/space-telescopes-and-instrumentation-uv-to-gamma?SSO=1

Conference

ConferenceSpace Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
Country/TerritoryCanada
CityMontréal
Period17/07/202222/07/2022
Internet address
SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume12181
ISSN0277-786X

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