Optimization of Cantilever Probes for Atomic Force Microscopy

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationDesign, Test, and Microfrabrication of MEMS and MOEMS
    Place of PublicationWashington - USA
    PublisherSPIE - The International Society for Optical Engineering
    Publication date1999
    Pages131-140
    Publication statusPublished - 1999
    EventDTM - 99 - Paris - France
    Duration: 1 Jan 1999 → …

    Conference

    ConferenceDTM - 99
    CityParis - France
    Period01/01/1999 → …

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