Optically stimulated luminescence sensitivity changes in quartz due to repeated use in single aliquot readout: Experiments and computer simulations

S.W.S. McKeever, L. Bøtter-Jensen, N. Agersnap Larsen, V. Mejdahl, N.R.J. Poolton

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    As part of a study to examine sensitivity changes in single aliquot techniques using optically stimulated luminescence (OSL) a series of experiments has been conducted with single aliquots of natural quartz, and the data compared with the results of computer simulations of the type of processes believed to be occurring. The computer model used includes both shallow and deep ('hard-to-bleach') traps, OSL ('easy-to-bleach') traps, and radiative and non-radiative recombination centres. The model has previously been used successfully to account for sensitivity changes in quartz due to thermal annealing. The simulations are able to reproduce qualitatively the main features of the experimental results including sensitivity changes as a function of reuse, and their dependence upon bleaching time and laboratory dose. The sensitivity changes are believed to be the result of a combination of shallow trap and deep trap effects.
    Original languageEnglish
    JournalRadiation Protection Dosimetry
    Volume65
    Issue number1-4
    Pages (from-to)49-54
    ISSN0144-8420
    Publication statusPublished - 1996
    Event11th International Conference on Solid State Dosimetry - Budapest, Hungary
    Duration: 10 Jul 199514 Jul 1995

    Conference

    Conference11th International Conference on Solid State Dosimetry
    CountryHungary
    CityBudapest
    Period10/07/199514/07/1995

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