Optical waveform sampling and error-free demultiplexing of 1.28 Tbit/s serial data in a silicon nanowire: [post deadline]

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    241 Downloads (Pure)

    Abstract

    We experimentally demonstrate 640 Gbit/s and 1.28 Tbit/s serial data optical waveform sampling and 640-to-10 Gbit/s and 1.28 Tbit/s-to-10 Gbit/s error-free demultiplexing using four-wave mixing in a 300nm$$450nm$$5mm silicon nanowire.
    Original languageEnglish
    Title of host publication2010 Conference on (OFC/NFOEC) Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference
    PublisherIEEE
    Publication date2010
    Pages1-3
    Publication statusPublished - 2010
    Event2010 Optical Fiber Communication Conference and Exposition and the National Fiber Optic Engineers Conference - San Diego, CA, United States
    Duration: 21 Mar 201025 Mar 2010
    http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=16897

    Conference

    Conference2010 Optical Fiber Communication Conference and Exposition and the National Fiber Optic Engineers Conference
    Country/TerritoryUnited States
    CitySan Diego, CA
    Period21/03/201025/03/2010
    Internet address

    Bibliographical note

    Copyright 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

    Fingerprint

    Dive into the research topics of 'Optical waveform sampling and error-free demultiplexing of 1.28 Tbit/s serial data in a silicon nanowire: [post deadline]'. Together they form a unique fingerprint.

    Cite this