Optical Waveform Sampling and Error-Free Demultiplexing of 1.28 Tb/s Serial Data in a Nanoengineered Silicon Waveguide

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Abstract

This paper presents the experimental demonstrations of using a pure nanoengineered silicon waveguide for 1.28 Tb/s serial data optical waveform sampling and 1.28 Tb/s–10 Gb/s error free demultiplexing. The 330-fs pulses are resolved in each 780-fs time slot in waveform sampling. Error-free operation is achieved in the 1.28 Tb/s–10 Gb/s demultiplexing.
Original languageEnglish
JournalJournal of Lightwave Technology
Volume29
Issue number4
Pages (from-to)426-431
ISSN0733-8724
DOIs
Publication statusPublished - 2011

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