Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

M. Takeda (Invited author), W. Wang (Invited author), Steen Grüner Hanson (Invited author), Y. Miyamoto (Invited author)

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Abstract

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.
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Original languageEnglish
Title of host publicationProceedings
Place of PublicationBellingham
PublisherSPIE - International Society for Optical Engineering
Publication date2008
DOIs
Publication statusPublished - 2008
Event8th International Conference on Correlation Optics - Chernivtsi, Ukraine
Duration: 11 Sep 200714 Sep 2007
Conference number: 8

Conference

Conference8th International Conference on Correlation Optics
Number8
CountryUkraine
CityChernivtsi
Period11/09/200714/09/2007
SeriesSPIE Proceedings Series, 7008

Cite this

Takeda, M., Wang, W., Hanson, S. G., & Miyamoto, Y. (2008). Optical vortex metrology: Are phase singularities foes or friends in optical metrology? In Proceedings SPIE - International Society for Optical Engineering. SPIE Proceedings Series, 7008 https://doi.org/10.1117/12.797345