Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

M. Takeda; W. Wang; Steen Grüner Hanson; Y. Miyamoto

doi:10.1117/12.797345

Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

M. Takeda (Invited author), W. Wang (Invited author), Steen Grüner Hanson (Invited author), Y. Miyamoto (Invited author)

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.
© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Original language	English
Title of host publication	Proceedings
Place of Publication	Bellingham
Publisher	SPIE - International Society for Optical Engineering
Publication date	2008
DOIs	https://doi.org/10.1117/12.797345
Publication status	Published - 2008
Event	8th International Conference on Correlation Optics - Chernivtsi, Ukraine Duration: 11 Sep 2007 → 14 Sep 2007 Conference number: 8

Conference

Conference	8th International Conference on Correlation Optics
Number	8
Country	Ukraine
City	Chernivtsi
Period	11/09/2007 → 14/09/2007

Series	SPIE Proceedings Series, 7008

Access to Document

10.1117/12.797345

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@inproceedings{bc23dd67787f4ac48d9b151b7625fe87,

title = "Optical vortex metrology: Are phase singularities foes or friends in optical metrology?",

abstract = "We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.{\textcopyright} (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.",

author = "M. Takeda and W. Wang and Hanson, {Steen Gr{\"u}ner} and Y. Miyamoto",

year = "2008",

doi = "10.1117/12.797345",

language = "English",

series = "SPIE Proceedings Series, 7008",

booktitle = "Proceedings",

publisher = "SPIE - International Society for Optical Engineering",

note = "8th International Conference on Correlation Optics, CO'07 ; Conference date: 11-09-2007 Through 14-09-2007",

}

Takeda, M, Wang, W, Hanson, SG & Miyamoto, Y 2008, Optical vortex metrology: Are phase singularities foes or friends in optical metrology? in Proceedings. SPIE - International Society for Optical Engineering, Bellingham, SPIE Proceedings Series, 7008, 8th International Conference on Correlation Optics, Chernivtsi, Ukraine, 11/09/2007. https://doi.org/10.1117/12.797345

Optical vortex metrology: Are phase singularities foes or friends in optical metrology? / Takeda, M. (Invited author); Wang, W. (Invited author); Hanson, Steen Grüner (Invited author); Miyamoto, Y. (Invited author).

Proceedings. Bellingham : SPIE - International Society for Optical Engineering, 2008. (SPIE Proceedings Series, 7008).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review