Abstract
We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.
© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
| Original language | English |
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| Title of host publication | Proceedings |
| Place of Publication | Bellingham |
| Publisher | SPIE - International Society for Optical Engineering |
| Publication date | 2008 |
| DOIs | |
| Publication status | Published - 2008 |
| Event | 8th International Conference on Correlation Optics - Chernivtsi, Ukraine Duration: 11 Sep 2007 → 14 Sep 2007 Conference number: 8 |
Conference
| Conference | 8th International Conference on Correlation Optics |
|---|---|
| Number | 8 |
| Country | Ukraine |
| City | Chernivtsi |
| Period | 11/09/2007 → 14/09/2007 |
| Series | SPIE Proceedings Series, 7008 |
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Cite this
Takeda, M., Wang, W., Hanson, S. G., & Miyamoto, Y. (2008). Optical vortex metrology: Are phase singularities foes or friends in optical metrology? In Proceedings SPIE - International Society for Optical Engineering. SPIE Proceedings Series, 7008 https://doi.org/10.1117/12.797345