TY - JOUR
T1 - Optical signatures of electron-phonon decoupling due to strong light-matter interactions
AU - Denning, Emil Vosmar
AU - Bundgaard-Nielsen, Matias
AU - Mørk, Jesper
PY - 2020
Y1 - 2020
N2 - Phonon interactions in solid-state photonics systems cause intrinsic quantum decoherence and often present the limiting factor in emerging quantum technology. Due to recent developments in nanophotonics, exciton-cavity structures with very strong light-matter coupling rates can be fabricated. We show that in such structures, a regime emerges where the decoherence is completely suppressed due to decoupling of the dominant phonon process. Using a numerically exact tensor network approach, we perform calculations in this nonperturbative, non-Markovian dynamical regime. Here, we identify a strategy for reaching near-unity photon indistinguishability and also discover an interesting phonon dressing of the exciton-cavity polaritons in the high-Q regime, leading to multiple phonon sidebands when the light-matter interaction is sufficiently strong.
AB - Phonon interactions in solid-state photonics systems cause intrinsic quantum decoherence and often present the limiting factor in emerging quantum technology. Due to recent developments in nanophotonics, exciton-cavity structures with very strong light-matter coupling rates can be fabricated. We show that in such structures, a regime emerges where the decoherence is completely suppressed due to decoupling of the dominant phonon process. Using a numerically exact tensor network approach, we perform calculations in this nonperturbative, non-Markovian dynamical regime. Here, we identify a strategy for reaching near-unity photon indistinguishability and also discover an interesting phonon dressing of the exciton-cavity polaritons in the high-Q regime, leading to multiple phonon sidebands when the light-matter interaction is sufficiently strong.
U2 - 10.1103/PhysRevB.102.235303
DO - 10.1103/PhysRevB.102.235303
M3 - Journal article
SN - 1098-0121
VL - 102
JO - Physical Review B
JF - Physical Review B
IS - 23
M1 - 235303
ER -