Optical localization of quantum dots in tapered nanowires

Andreas Dyhl Østerkryger, Niels Gregersen, Romain Fons, Petr Stepanov, Tomasz Jakubczyk, Joël Bleuse, Jean-Michel Gérard, Julien Claudon

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

In this work we have measured the far-field emission patterns of In As quantum dots embedded in a GaAs tapered nanowire and used an open-geometry Fourier modal method for determining the radial position of the quantum dots by computing the far-field emission pattern for different quantum dot locations.
Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Numerical Simulation of Optoelectronic Devices
Volume2017
PublisherIEEE
Publication date2017
Pages119-20
DOIs
Publication statusPublished - 2017
Event17th International Conference on Numerical Simulation of Optoelectronic Devices - Technical University of Denmark, Lyngby, Denmark
Duration: 24 Jul 201728 Jul 2017
Conference number: 17

Conference

Conference17th International Conference on Numerical Simulation of Optoelectronic Devices
Number17
LocationTechnical University of Denmark
CountryDenmark
CityLyngby
Period24/07/201728/07/2017
SeriesProceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, Nusod
ISSN2158-3242

Cite this

Østerkryger, A. D., Gregersen, N., Fons, R., Stepanov, P., Jakubczyk, T., Bleuse, J., ... Claudon, J. (2017). Optical localization of quantum dots in tapered nanowires. In Proceedings of the 17th International Conference on Numerical Simulation of Optoelectronic Devices (Vol. 2017, pp. 119-20). IEEE. Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, Nusod https://doi.org/10.1109/NUSOD.2017.8010020