Abstract
Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the use application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of fiber taper, and a highly sensitive in-line temperature sensor in PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired air holes of PCF.
Original language | English |
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Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 8421 |
Pages (from-to) | 842173 |
Number of pages | 4 |
ISSN | 0277-786X |
DOIs | |
Publication status | Published - 2012 |
Event | 22nd International Conference on Optical Fiber Sensors (OFS 2012) - Beijing, China Duration: 15 Oct 2012 → 19 Oct 2012 Conference number: 22 http://www.ofs-22.org/site/ |
Conference
Conference | 22nd International Conference on Optical Fiber Sensors (OFS 2012) |
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Number | 22 |
Country/Territory | China |
City | Beijing |
Period | 15/10/2012 → 19/10/2012 |
Internet address |
Keywords
- Fiber sensor
- Focused Ion Beam
- Lab-on-fiber