Optical fiber sensors fabricated by the focused ion beam technique

Scott Wu Yuan, Fei Wang, Ole Bang

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the use application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of fiber taper, and a highly sensitive in-line temperature sensor in PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired air holes of PCF.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume8421
Pages (from-to)842173
Number of pages4
ISSN0277-786X
DOIs
Publication statusPublished - 2012
Event22nd International Conference on Optical Fiber Sensors (OFS 2012) - Beijing, China
Duration: 15 Oct 201219 Oct 2012
Conference number: 22
http://www.ofs-22.org/site/

Conference

Conference22nd International Conference on Optical Fiber Sensors (OFS 2012)
Number22
CountryChina
CityBeijing
Period15/10/201219/10/2012
Internet address

Keywords

  • Fiber sensor
  • Focused Ion Beam
  • Lab-on-fiber

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