Optical fiber sensors fabricated by the focused ion beam technique

Scott Wu Yuan, Fei Wang, Ole Bang

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the use application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of fiber taper, and a highly sensitive in-line temperature sensor in PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired air holes of PCF.
    Original languageEnglish
    JournalProceedings of SPIE - The International Society for Optical Engineering
    Volume8421
    Pages (from-to)842173
    Number of pages4
    ISSN0277-786X
    DOIs
    Publication statusPublished - 2012
    Event22nd International Conference on Optical Fiber Sensors (OFS 2012) - Beijing, China
    Duration: 15 Oct 201219 Oct 2012
    Conference number: 22
    http://www.ofs-22.org/site/

    Conference

    Conference22nd International Conference on Optical Fiber Sensors (OFS 2012)
    Number22
    Country/TerritoryChina
    CityBeijing
    Period15/10/201219/10/2012
    Internet address

    Keywords

    • Fiber sensor
    • Focused Ion Beam
    • Lab-on-fiber

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