Optical constants in the hard X-ray/Soft gamma ray range of selected materials for multilayer reflectors

Carsten P. Cooper-Jensen, S. Romaine, R. Bruni, Finn Erland Christensen, Z. Zhong

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Future Astrophysics missions operating in the hard X-ray/Soft Gamma ray range is slated to carry novel focusing telescopes based on the use of depth graded multilayer reflectors. Current design studies show that, at the foreseen focal lengths, it should be feasible to focus X-rays at energies as high as 300 keV. These designs use extrapolations of theoretical and experimentally determined optical constants from below 200 keV. In this paper we report on the first experimental determination of optical constants up to and above 200 keV. We present these first results as obtained at the National Synchrotron Light Source in Brookhaven and compare these to results obtained previously up to 180 keV of some of the same materials at the European Synchrotron Radiation Facility in Grenoble.
Original languageEnglish
Title of host publicationOPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY III
Volume6688
PublisherSpie-int Soc Optical Engineering
Publication date2007
ISBN (Print)978-0-8194-6836-9
Publication statusPublished - 2007
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy III - San Diego, CA, United States
Duration: 29 Aug 200730 Aug 2007

Conference

ConferenceOptics for EUV, X-Ray, and Gamma-Ray Astronomy III
CountryUnited States
CitySan Diego, CA
Period29/08/200730/08/2007

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