Optical characterization of low-temperature grown GaAs by transmission measurements above the band gap

D. Streb, M. Ruff, S. U. Dankowski, P. Kiesel, M. Kneissl, S. Malzer, Ulrich Dieter Felix Keil, G. H. Döhler

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures
    Pages (from-to)2275
    Publication statusPublished - 1996

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