Optical characterization of directly deposited graphene on a dielectric substrate

Research output: Contribution to journalJournal article – Annual report year: 2016Researchpeer-review

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  • Author: Kaplas, Tommi

    University of Eastern Finland, Finland

  • Author: Karvonen, Lasse

    Aalto University, Finland

  • Author: Ahmadi, Sepehr

    Quantum Physics and Information Techology, Department of Physics, Technical University of Denmark, Denmark

  • Author: Amirsolaimani, Babak

    University of Arizona, United States

  • Author: Mehravar, Soroush

    University of Arizona, United States

  • Author: Peyghambarian, Nasser

    University of Eastern Finland, Finland

  • Author: Kieu, Khanh

    University of Arizona, United States

  • Author: Honkanen, Seppo

    University of Eastern Finland, Finland

  • Author: Lipsanen, Harri

    Aalto University, Finland

  • Author: Svirko, Yuri

    University of Eastern Finland, Finland

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By using scanning multiphoton microscopy we compare the nonlinear optical properties of the directly deposited and transferred to the dielectric substrate graphene. The direct deposition of graphene on oxidized silicon wafer was done by utilizing sacrificial copper catalyst film. We demonstrate that the directly deposited graphene and bi-layered transferred graphene produce comparable third harmonic signals and have almost the same damage thresholds. Therefore, we believe directly deposited graphene is suitable for the use of e.g. nanofabricated optical setups. (C) 2016 Optical Society of America
Original languageEnglish
JournalOptics Express
Volume24
Issue number3
Pages (from-to)2965-2970
Number of pages6
ISSN1094-4087
DOIs
Publication statusPublished - 2016
CitationsWeb of Science® Times Cited: No match on DOI

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