Abstract
In this paper, InP HBTs featuring maximum oscillation frequencies fmax in the sub-THz range are characterized by conducting on-wafer 16 -term calibration. A direct comparison between 8-term calibration and 16-term calibration demonstrates that the 16 -term calibration improves the way transistor Mason's gain is derived. The on-wafer measurements of transistors with emitter widths of 0.5μm and 0.85 μm yield extracted fmax values of 0.44 THz and 0.33 THz, respectively. The study shows that choosing proper on-wafer calibration techniques is highly important for reliable transistor characterization.
| Original language | English |
|---|---|
| Title of host publication | 2025 55th European Microwave Conference (EuMC) |
| Publisher | IEEE |
| Publication date | 2025 |
| Pages | 687-690 |
| ISBN (Electronic) | 978-2-87487-081-1 |
| DOIs | |
| Publication status | Published - 2025 |
| Event | 55th European Microwave Conference (EuMC) - Utrecht, Netherlands Duration: 23 Sept 2025 → 25 Sept 2025 |
Conference
| Conference | 55th European Microwave Conference (EuMC) |
|---|---|
| Country/Territory | Netherlands |
| City | Utrecht |
| Period | 23/09/2025 → 25/09/2025 |
Keywords
- 16-term calibration
- 8-term calibration
- InP HBTs
- On-wafer measurements
- Transistor characterization
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