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On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction

  • B. Buras
  • , J. Staun Olsen
  • , Leif Gerward

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.
Original languageEnglish
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume178
Issue number1
Pages (from-to)131-135
ISSN0168-9002
DOIs
Publication statusPublished - 1980

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