Abstract
The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.
| Original language | English |
|---|---|
| Journal | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 178 |
| Issue number | 1 |
| Pages (from-to) | 131-135 |
| ISSN | 0168-9002 |
| DOIs | |
| Publication status | Published - 1980 |
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