On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction

B. Buras; J. Staun Olsen; Leif Gerward

doi:10.1016/0029-554X(80)90867-8

On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction

B. Buras, J. Staun Olsen, Leif Gerward

Department of Physics

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.

Original language	English
Journal	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	178
Issue number	1
Pages (from-to)	131-135
ISSN	0168-9002
DOIs	https://doi.org/10.1016/0029-554X(80)90867-8
Publication status	Published - 1980

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title = "On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction",

abstract = "The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.",

author = "B. Buras and {Staun Olsen}, J. and Leif Gerward",

year = "1980",

doi = "10.1016/0029-554X(80)90867-8",

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pages = "131--135",

journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

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number = "1",

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On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction. / Buras, B.; Staun Olsen, J.; Gerward, Leif.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 178, No. 1, 1980, p. 131-135.

Research output: Contribution to journal › Journal article › Research › peer-review

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T1 - On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction

AU - Buras, B.

AU - Staun Olsen, J.

AU - Gerward, Leif

PY - 1980

Y1 - 1980

N2 - The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.

AB - The possible applications of multiple-element or large-area semiconductor detectors in single-crystal X-ray diffraction are discussed on the basis of experimental results using Bremsstrahlung as well as synchrotron radiation.

U2 - 10.1016/0029-554X(80)90867-8

DO - 10.1016/0029-554X(80)90867-8

M3 - Journal article

SN - 0168-9002

VL - 178

SP - 131

EP - 135

JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 1

ER -

On the Use of Wide-Angle Energy-Sensitive Detectors in White-Beam X-Ray Single-Crystal Diffraction

Abstract

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