Abstract
Azimuthal mode (m mode) truncation of a high-order
probe pattern in probe-corrected spherical near-field
antenna measurements is studied in this paper. The
results of this paper provide rules for appropriate and
sufficient m-mode truncation for non-ideal first-order
probes and odd-order probes with approximately
10dBi directivity. The presented azimuthal mode
truncation rules allow minimizing the measurement
burden of the probe pattern calibration and reducing
the computational burden of the probe pattern
correction.
Original language | English |
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Title of host publication | Proceedings of the 33rd Annual Symposium of the Antenna Measurement Techniques Association |
Publication date | 2011 |
Publication status | Published - 2011 |
Event | 33rd Annual Symposium of the Antenna Measurement Techniques Association (AMTA) - Englewood, Colorado, USA Duration: 1 Jan 2011 → … |
Conference
Conference | 33rd Annual Symposium of the Antenna Measurement Techniques Association (AMTA) |
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City | Englewood, Colorado, USA |
Period | 01/01/2011 → … |
Keywords
- Probe correction
- Near-field measurement