On the sensitivity of probe-corrected spherical near-field antenna measurements with high-order probes using double phi-step theta-scanning scheme against various measurement uncertainties

Tommi Laitinen, Sergey Pivnenko, Jeppe Majlund Nielsen, Olav Breinbjerg

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    In this paper, the relatively recently introduced double phi-step theta-scanning scheme and the probe correction technique associated with it is examined against the traditional phi-scanning scheme and the first-order probe correction. The important result of this paper is that the double phi-step theta-scanning scheme is shown to be clearly less sensitive to the probe misalignment errors compared to the phi-scanning scheme. The two methods show similar sensitivity to noise and channel balance error.
    Original languageEnglish
    Title of host publicationProceedings of the 5. European Conference on Antennas and Propagation
    PublisherIEEE
    Publication date2011
    ISBN (Print)978-1-4577-0250-1
    Publication statusPublished - 2011
    Event5th European Conference on Antennas and Propagation - Rome, Italy
    Duration: 11 Apr 201115 Apr 2011
    Conference number: 5
    http://www.eucap2011.org/

    Conference

    Conference5th European Conference on Antennas and Propagation
    Number5
    Country/TerritoryItaly
    CityRome
    Period11/04/201115/04/2011
    Internet address

    Keywords

    • Measurement uncertainty
    • Antenna theory
    • Matrix algebra
    • Probes
    • Fast Fourier transforms

    Fingerprint

    Dive into the research topics of 'On the sensitivity of probe-corrected spherical near-field antenna measurements with high-order probes using double phi-step theta-scanning scheme against various measurement uncertainties'. Together they form a unique fingerprint.

    Cite this