On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

Clemens Woda; Steffen Greilich; Koen Beerten

doi:10.1016/j.radmeas.2010.01.041

On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

Clemens Woda
, Steffen Greilich
, Koen Beerten

Helmholtz Zentrum München - German Research Center for Environmental Health
Belgian Nuclear Research Center

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 °C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.

Original language	English
Journal	Radiation Measurements
Volume	45
Issue number	3-6
Pages (from-to)	746-748
ISSN	1350-4487
DOIs	https://doi.org/10.1016/j.radmeas.2010.01.041
Publication status	Published - 2010
Event	7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation - Kraków, Poland Duration: 12 Jul 2009 → 17 Jul 2009 Conference number: 7

Conference

Conference	7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation
Number	7
Country/Territory	Poland
City	Kraków
Period	12/07/2009 → 17/07/2009

Keywords

Radiation research and nuclear technologies
Radiation physics

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10.1016/j.radmeas.2010.01.041

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title = "On the OSL curve shape and preheat treatment of electronic components from portable electronic devices",

abstract = "The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 °C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.",

keywords = "Radiation research and nuclear technologies, Radiation physics, Str{\aa}lingsfysik, Str{\aa}lingsforskning og nukleare teknologier",

author = "Clemens Woda and Steffen Greilich and Koen Beerten",

year = "2010",

doi = "10.1016/j.radmeas.2010.01.041",

language = "English",

volume = "45",

pages = "746--748",

journal = "Radiation Measurements",

issn = "1350-4487",

publisher = "Elsevier",

number = "3-6",

note = "7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation, LUMDETR 2009 ; Conference date: 12-07-2009 Through 17-07-2009",

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TY - GEN

T1 - On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

AU - Woda, Clemens

AU - Greilich, Steffen

AU - Beerten, Koen

N1 - Conference code: 7

PY - 2010

Y1 - 2010

N2 - The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 °C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.

AB - The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 °C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.

KW - Radiation research and nuclear technologies

KW - Radiation physics

KW - Strålingsfysik

KW - Strålingsforskning og nukleare teknologier

U2 - 10.1016/j.radmeas.2010.01.041

DO - 10.1016/j.radmeas.2010.01.041

M3 - Conference article

SN - 1350-4487

VL - 45

SP - 746

EP - 748

JO - Radiation Measurements

JF - Radiation Measurements

IS - 3-6

T2 - 7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation

Y2 - 12 July 2009 through 17 July 2009

ER -

On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

Abstract

Conference

Keywords

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