On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

Clemens Woda, Steffen Greilich, Koen Beerten

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 °C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.
    Original languageEnglish
    JournalRadiation Measurements
    Volume45
    Issue number3-6
    Pages (from-to)746-748
    ISSN1350-4487
    DOIs
    Publication statusPublished - 2010
    Event7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation - Kraków, Poland
    Duration: 12 Jul 200917 Jul 2009
    Conference number: 7

    Conference

    Conference7th European Conference on Luminescent Detectors and Transformers of Ionizing Radiation
    Number7
    CountryPoland
    CityKraków
    Period12/07/200917/07/2009

    Keywords

    • Radiation research and nuclear technologies
    • Radiation physics

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