Abstract
It is suggested that a correct interpretation of partial-discharge transients can be obtained only through the concept of induced charge. The application of this concept enables a partial-discharge theory to be developed by means of which the influence of relevant void parameters can be assessed in a correct way. It is argued that the widely adopted abc-capacitance model does not allow this insight to be achieved. In addition, it is claimed that the abc-model is based on an erroneous application of the concept of capacitance, and, although this simple approach can be a useful tool when discussing measuring techniques, it may lead to quite incorrect conclusions. The relationship between the transients in the applied voltage and current pulses leading to partial breakdown and the induced charge is found
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics |
| Publisher | IEEE |
| Publication date | 1989 |
| Pages | 107-116 |
| DOIs | |
| Publication status | Published - 1989 |
| Event | 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway Duration: 3 Jul 1989 → 6 Jul 1989 Conference number: 3 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=826 |
Conference
| Conference | 3rd International Conference on Conduction and Breakdown in Solid Dielectrics |
|---|---|
| Number | 3 |
| Country/Territory | Norway |
| City | Trondheim |
| Period | 03/07/1989 → 06/07/1989 |
| Internet address |
Bibliographical note
Copyright 1989 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.Fingerprint
Dive into the research topics of 'On the electrodynamics of partial discharges in voids in solid dielectrics'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver