Abstract
Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion of lattice strains into residual stress and (3) the composition dependence of these elastic constants.
Original language | English |
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Journal | Acta Materialia |
Volume | 94 |
Pages (from-to) | 271-280 |
ISSN | 1359-6454 |
DOIs | |
Publication status | Published - 2015 |
Keywords
- Low temperature surface hardening
- Gas nitriding
- Expanded austenite
- X-ray diffraction
- Stress analysis