Abstract
The chemical diffusion in thin trilayer films of TM-TM100−xZrx-TM with an amorphous middle layer where TM=Co, Hi, or Fe and in amorphous Fe-Zr and Ni-Zr films with composition gradients has been investigated using Rutherford backscattering spectrometry. The growth of the amorphous layer in the trilayers, due to in-diffusion of cobalt and nickel, is initially found to be proportional to the square root of the time, t1/2, and subsequently found to level off before the compositions corresponding to metastable equilibria are reached. Irradiation, with 500 keV Xe+ ions, is found to promote the in-diffusion. This behavior is discussed in terms of structural relaxation effects and their influence on the metastable equilibrium. In amorphous Fe-Zr the chemical diffusivity is observed to be very sluggish. Contrary to the behavior in Co-Zr and Ni-Zr trilayers, the direction of the iron diffusion in Fe-Zr trilayers suggests a broad positive peak in the Gibbs free energy at a composition around 50 at.% Zr.
Original language | English |
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Journal | Journal of Materials Research |
Volume | 7 |
Issue number | 4 |
Pages (from-to) | 926-933 |
ISSN | 0884-2914 |
DOIs | |
Publication status | Published - 1992 |
Externally published | Yes |
Keywords
- Diffusion - Radiation Effects
- Films - Growing
- Spectrometry
- Transition Metals - Amorphous
- Transition Metals - Stability
- Transition Metals
- X
- Layered Thin Films
- Rutherford Backscattering Spectrometry