Activities per year
Original language | English |
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Publication date | 2017 |
Number of pages | 1 |
Publication status | Published - 2017 |
Event | Microscopy and Microanalysis 2017 - St. Louis, United States Duration: 6 Aug 2017 → 10 Aug 2017 |
Conference
Conference | Microscopy and Microanalysis 2017 |
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Country/Territory | United States |
City | St. Louis |
Period | 06/08/2017 → 10/08/2017 |
Activities
- 1 Conference presentations
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Observing beam effects and their thresholds in the environmental transmission electron microscope
Hansen, T. W. (Guest lecturer)
6 Aug 2017Activity: Talks and presentations › Conference presentations
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