Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

U. Lienert, J. Almer, L. Margulies, Søren Fæster Nielsen, W. Pantleon, H.F. Poulsen, Søren Schmidt

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	2002
Publication status	Published - 2002
Event	51st Annual Denver X-Ray Conference - Colorado Springs , United States Duration: 29 Jul 2002 → 2 Aug 2002

Conference	51st Annual Denver X-Ray Conference
Country/Territory	United States
City	Colorado Springs
Period	29/07/2002 → 02/08/2002

OpenUrl availability

@conference{17890febe99b4577b1bc9dcd05147363,

title = "Observation of high-resolution diffraction profiles from single grains within polycrystalline metals",

keywords = "5-I nano",

author = "U. Lienert and J. Almer and L. Margulies and {F{\ae}ster Nielsen}, S{\o}ren and W. Pantleon and H.F. Poulsen and S{\o}ren Schmidt",

year = "2002",

language = "English",

note = "51st Annual Denver X-Ray Conference ; Conference date: 29-07-2002 Through 02-08-2002",

}

TY - ABST

T1 - Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

AU - Lienert, U.

AU - Almer, J.

AU - Margulies, L.

AU - Fæster Nielsen, Søren

AU - Pantleon, W.

AU - Poulsen, H.F.

AU - Schmidt, Søren

PY - 2002

Y1 - 2002

KW - 5-I nano

M3 - Conference abstract for conference

T2 - 51st Annual Denver X-Ray Conference

Y2 - 29 July 2002 through 2 August 2002

ER -