Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	2002
Publication status	Published - 2002
Event	51. Annual Denver X-ray conference - Colorado Springs (US), 29 Jul - 2 Aug Duration: 1 Jan 2002 → …

Conference	51. Annual Denver X-ray conference
City	Colorado Springs (US), 29 Jul - 2 Aug
Period	01/01/2002 → …

OpenUrl availability

@conference{17890febe99b4577b1bc9dcd05147363,

title = "Observation of high-resolution diffraction profiles from single grains within polycrystalline metals",

keywords = "5-I nano",

author = "U. Lienert and J. Almer and L. Margulies and {F{\ae}ster Nielsen}, S{\o}ren and W. Pantleon and H.F. Poulsen and S{\o}ren Schmidt",

year = "2002",

language = "English",

note = "51. Annual Denver X-ray conference ; Conference date: 01-01-2002",

}

TY - ABST

T1 - Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

AU - Lienert, U.

AU - Almer, J.

AU - Margulies, L.

AU - Fæster Nielsen, Søren

AU - Pantleon, W.

AU - Poulsen, H.F.

AU - Schmidt, Søren

PY - 2002

Y1 - 2002

KW - 5-I nano

M3 - Conference abstract for conference

T2 - 51. Annual Denver X-ray conference

Y2 - 1 January 2002

ER -