Observation of high-resolution diffraction profiles from single grains within polycrystalline metals

U. Lienert, J. Almer, L. Margulies, Søren Fæster Nielsen, W. Pantleon, H.F. Poulsen, Søren Schmidt

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date2002
    Publication statusPublished - 2002
    Event51st Annual Denver X-Ray Conference - Colorado Springs , United States
    Duration: 29 Jul 20022 Aug 2002


    Conference51st Annual Denver X-Ray Conference
    Country/TerritoryUnited States
    CityColorado Springs

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