Observation and Analysis of an Electrically Active Layer at the Core-Shell Interface of a GaN Nanowire by Advanced Electron Microscopy

S. Yazdi, Takeshi Kasama, R. Ciechonski, Jakob Birkedal Wagner, R.E. Dunin-Borkowski, E. Ringe

    Research output: Contribution to journalConference abstract in journalResearchpeer-review

    Original languageEnglish
    JournalMicroscopy and Microanalysis
    Volume23
    Issue numberSuppl 1
    Pages (from-to)1406-1407
    ISSN1431-9276
    DOIs
    Publication statusPublished - 2017
    Event Microscopy and Microanalysis conference 2017 - St. Louis, United States
    Duration: 6 Aug 201710 Aug 2017

    Conference

    Conference Microscopy and Microanalysis conference 2017
    CountryUnited States
    CitySt. Louis
    Period06/08/201710/08/2017

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