Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite

Finn Erland Christensen; B.P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Herbert W. Schnopper

doi:10.1117/12.23236

Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite

Finn Erland Christensen, B.P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, Herbert W. Schnopper

Technical University of Denmark

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.

© (1990) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

Original language	English
Title of host publication	EUV, X-ray, and γ-ray Instrumentation for Astronomy
Publisher	SPIE - International Society for Optical Engineering
Publication date	1990
Pages	14-22
ISBN (Print)	0-8194-0405-5
DOIs	https://doi.org/10.1117/12.23236
Publication status	Published - 1990
Event	Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy - San Diego, United States Duration: 11 Jul 1990 → 13 Jul 1990

Conference

Conference	Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Country/Territory	United States
City	San Diego
Period	11/07/1990 → 13/07/1990

Series	Proceedings of SPIE - The International Society for Optical Engineering
ISSN	0277-786X

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title = "Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite",

abstract = "The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.{\textcopyright} (1990) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.",

author = "Christensen, {Finn Erland} and B.P. Byrnak and Allan Hornstrup and Shou-Hua Zhu and Schnopper, {Herbert W.}",

year = "1990",

doi = "10.1117/12.23236",

language = "English",

isbn = "0-8194-0405-5",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE - International Society for Optical Engineering",

pages = "14--22",

booktitle = "EUV, X-ray, and γ-ray Instrumentation for Astronomy",

note = "Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy ; Conference date: 11-07-1990 Through 13-07-1990",

}

Christensen, FE, Byrnak, BP, Hornstrup, A, Zhu, S-H & Schnopper, HW 1990, Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite. in EUV, X-ray, and γ-ray Instrumentation for Astronomy. SPIE - International Society for Optical Engineering, Proceedings of SPIE - The International Society for Optical Engineering, pp. 14-22, Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, San Diego, California, United States, 11/07/1990. https://doi.org/10.1117/12.23236

Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite. / Christensen, Finn Erland; Byrnak, B.P.; Hornstrup, Allan et al.
EUV, X-ray, and γ-ray Instrumentation for Astronomy. SPIE - International Society for Optical Engineering, 1990. p. 14-22 (Proceedings of SPIE - The International Society for Optical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite

AU - Christensen, Finn Erland

AU - Byrnak, B.P.

AU - Hornstrup, Allan

AU - Zhu, Shou-Hua

AU - Schnopper, Herbert W.

PY - 1990

Y1 - 1990

N2 - The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.© (1990) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

AB - The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.© (1990) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

U2 - 10.1117/12.23236

DO - 10.1117/12.23236

M3 - Article in proceedings

SN - 0-8194-0405-5

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 14

EP - 22

BT - EUV, X-ray, and γ-ray Instrumentation for Astronomy

PB - SPIE - International Society for Optical Engineering

T2 - Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy

Y2 - 11 July 1990 through 13 July 1990

ER -

Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite

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