Objective Crystal Spectrometer (OXS) for the Spectrum-X-γ satellite

Finn Erland Christensen, B.P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, Herbert W. Schnopper

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.

    © (1990) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
    Original languageEnglish
    Title of host publicationEUV, X-ray, and γ-ray Instrumentation for Astronomy
    PublisherSPIE - International Society for Optical Engineering
    Publication date1990
    Pages14-22
    ISBN (Print)0-8194-0405-5
    DOIs
    Publication statusPublished - 1990
    EventConference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy - San Diego, CA, United States
    Duration: 11 Jul 199013 Jul 1990

    Conference

    ConferenceConference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
    Country/TerritoryUnited States
    CitySan Diego, CA
    Period11/07/199013/07/1990
    SeriesProceedings of SPIE - The International Society for Optical Engineering
    ISSN0277-786X

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