TY - JOUR
T1 - Novel response function resolves by image deconvolution more details of surface nanomorphology
AU - Andersen, Jens Enevold Thaulov
PY - 2010
Y1 - 2010
N2 - A novel method of image processing is presented which relies on deconvolution of data using
the response function of the apparatus. It is revealed that all the surface structures observed by
digital imaging are generated by a convolution of the response function of the apparatus with
the surfaces’ nanomorphology, which provided images of convoluted physical structures
rather than images of real physical structures. In order to restore the genuine physical
information on surface structures, a deconvolution using a novel response function of the
feedback circuitry is required. At the highest resolution, that is, atomic resolution, the effect of
deconvolution is at its maximum, whereas images at lower resolution are sharpened by
eliminating smoothing effects and shadow effects. The method is applied to measurements of
imaging by in situ scanning tunnelling microscopy (in situ STM) at atomic resolution and to
imaging by in situ STM of electrocrystallization of copper on gold in electrolytes containing
copper sulfate and sulfuric acid. It is suggested that the observed peaks of the recorded image
do not represent atoms, but the atomic structure may be recovered by image deconvolution
followed by calibration of distances, correction for drift phenomena and rotation in the plane
of the surface. The technology may subsequently reveal more details of molecular adsorbents.
The impact of in situ STM at atomic and lower resolution on imaging is discussed in the paper.
AB - A novel method of image processing is presented which relies on deconvolution of data using
the response function of the apparatus. It is revealed that all the surface structures observed by
digital imaging are generated by a convolution of the response function of the apparatus with
the surfaces’ nanomorphology, which provided images of convoluted physical structures
rather than images of real physical structures. In order to restore the genuine physical
information on surface structures, a deconvolution using a novel response function of the
feedback circuitry is required. At the highest resolution, that is, atomic resolution, the effect of
deconvolution is at its maximum, whereas images at lower resolution are sharpened by
eliminating smoothing effects and shadow effects. The method is applied to measurements of
imaging by in situ scanning tunnelling microscopy (in situ STM) at atomic resolution and to
imaging by in situ STM of electrocrystallization of copper on gold in electrolytes containing
copper sulfate and sulfuric acid. It is suggested that the observed peaks of the recorded image
do not represent atoms, but the atomic structure may be recovered by image deconvolution
followed by calibration of distances, correction for drift phenomena and rotation in the plane
of the surface. The technology may subsequently reveal more details of molecular adsorbents.
The impact of in situ STM at atomic and lower resolution on imaging is discussed in the paper.
U2 - 10.1088/0031-8949/82/05/055602
DO - 10.1088/0031-8949/82/05/055602
M3 - Journal article
SN - 0031-8949
VL - 82
JO - Physica Scripta
JF - Physica Scripta
IS - 5
ER -