Abstract
In this paper, a novel nanorobotic strategy for non-destructive and direct electrical characterization of as-grown bundles of single-walled carbon nanotubes (SWCNTs) is presented. For this purpose, test patterns of SWCNT bundles having different diameters are grown on a silicon substrate by chemical vapor deposition. A new design of microstructured four-point-probes is proposed and fabricated allowing for direct contacting of vertically aligned bundles of SWCNTs. A nanorobotic setup is upgraded into a dual endeffector system to achieve good electrical contact between four-point-probe and SWCNT bundle and to perform electrical measurements. First experimental results of non-destructive electrical characterization are presented and discussed.
Original language | English |
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Journal | 2010 IEEE International Conference on Robotics and Automation (ICRA) |
ISSN | 1050-4729 |
DOIs | |
Publication status | Published - 2010 |
Event | 2010 IEEE International Conference on Robotics and Automation - Anchorage, United States Duration: 3 May 2010 → 8 May 2010 https://ieeexplore.ieee.org/xpl/conhome/5501116/proceeding |
Conference
Conference | 2010 IEEE International Conference on Robotics and Automation |
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Country/Territory | United States |
City | Anchorage |
Period | 03/05/2010 → 08/05/2010 |
Internet address |