Nonlinear crystals for imaging and detection of mid-IR radiation

C. Pedersen*, A. S. Ashik, P. Tidemand-Lichtenberg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

The mid-IR wavelength range, i.e. 2-25 μm, houses the vibrational spectra of most gaßes and large molecules found in complex structures such as tißue, plastics or food. When designing an upconversion system for imaging or mid-IR detection, several aspects should be considered. Upconversion has several advantageous features which makes it an interesting option to consider for many mid-IR applications. Main advantages include, low-noise detection even at elevated temperatures, an almost instantaneous response time, phase preservation, and the ability to perform upconversion imaging. The χ(2) crystal properties impact the performance of the system significantly. Design aspects related to the choice of crystal as well as different applications is presented.

Original languageEnglish
Title of host publicationProceedings of SPIE
EditorsSailing He, Sailing He, Laurent Vivien
Number of pages6
Volume112841
PublisherSPIE - International Society for Optical Engineering
Publication date1 Jan 2020
Article number112841A
ISBN (Electronic)9781510633315
DOIs
Publication statusPublished - 1 Jan 2020
EventSmart Photonic and Optoelectronic Integrated Circuits XXII 2020 - San Francisco, United States
Duration: 3 Feb 20206 Feb 2020

Conference

ConferenceSmart Photonic and Optoelectronic Integrated Circuits XXII 2020
CountryUnited States
CitySan Francisco
Period03/02/202006/02/2020
SponsorSPIE
SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume11284
ISSN0277-786X

Keywords

  • Mid-IR imaging
  • Nonlinear phase matching
  • Sum frequency generation
  • Upconversion imaging

Cite this

Pedersen, C., Ashik, A. S., & Tidemand-Lichtenberg, P. (2020). Nonlinear crystals for imaging and detection of mid-IR radiation. In S. He, S. He, & L. Vivien (Eds.), Proceedings of SPIE (Vol. 112841). [112841A] SPIE - International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, Vol.. 11284 https://doi.org/10.1117/12.2550844