Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

M. Kageshima; Henriette Jensenius; M. Dienwiebel; Y. Nakayama; H. Tokumoto; S.P. Jarvis; T.H. Oosterkamp

doi:10.1016/S0169-4332(01)00975-8

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

M. Kageshima
, Henriette Jensenius
, M. Dienwiebel
, Y. Nakayama
, H. Tokumoto
, S.P. Jarvis
, T.H. Oosterkamp

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved.

Original language	English
Journal	Applied Surface Science
Volume	188
Issue number	3-4
Pages (from-to)	440-444
ISSN	0169-4332
DOIs	https://doi.org/10.1016/S0169-4332(01)00975-8
Publication status	Published - 2002

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@article{d49962f6ed504c9587f759f2f6c266b4,

title = "Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe",

abstract = "A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved. ",

author = "M. Kageshima and Henriette Jensenius and M. Dienwiebel and Y. Nakayama and H. Tokumoto and S.P. Jarvis and T.H. Oosterkamp",

year = "2002",

doi = "10.1016/S0169-4332(01)00975-8",

language = "English",

volume = "188",

pages = "440--444",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

AU - Kageshima, M.

AU - Jensenius, Henriette

AU - Dienwiebel, M.

AU - Nakayama, Y.

AU - Tokumoto, H.

AU - Jarvis, S.P.

AU - Oosterkamp, T.H.

PY - 2002

Y1 - 2002

N2 - A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved.

AB - A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved.

U2 - 10.1016/S0169-4332(01)00975-8

DO - 10.1016/S0169-4332(01)00975-8

M3 - Journal article

SN - 0169-4332

VL - 188

SP - 440

EP - 444

JO - Applied Surface Science

JF - Applied Surface Science

IS - 3-4

ER -

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Abstract

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