Non-uniform Grain Boundary Migration During Static Recrystallization: A Cellular Automaton Study

Abstract: During static recrystallization, grains often have non-constant and non-uniform growth rates, significantly affecting the recrystallization kinetics and the microstructure after recrystallization. A cellular automaton model was employed in order to evaluate the relative influences of gradients of stored energy, grain boundary curvature, and heterogeneity of grain boundary mobility on the non-uniform migration of grain boundary segments, leading to the formation of protrusions and retrusions. Electron back-scatter diffraction measurements of a cold-rolled copper microstructure served to feed the model. Orientation maps obtained after partial recrystallization were used to assess the model outcome. The model was capable to predict the shapes of recrystallized grains with retrusions and protrusions. Effects of different model assumptions were compared to reveal individual contributions of different factors to grain size distribution, grain shape and boundary roughness. The model predicted a decreasing average grain growth rate as a result of the progressive immobilization of an increasing fraction of grain boundary segments. The model prediction was compared with experimental results, explaining the origin of stationary boundaries and indicating some further improvements necessary to reach quantitative agreement.