Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide

Hugh Simons*, Anders Clemen Jakobsen, Sonja Rosenlund Ahl, Henning Friis Poulsen, Wolfgang Pantleon, Ying-Hao Chu, Carsten Detlefs, Nagarajan Valanoor

*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

The misfit dislocations formed at heteroepitaxial interfaces create long-ranging strain fields in addition to the epitaxial strain. For systems with strong lattice coupling, such as ferroic oxides, this results in unpredictable and potentially debilitating functionality and device performance. In this work, we use dark-field x-ray microscopy to map the lattice distortions around misfit dislocations in an epitaxial film of bismuth ferrite (BiFeO3) - a well-known multiferroic. We demonstrate the ability to precisely quantify weak, long-ranging strain fields and their associated symmetry lowering without modifying the mechanical state of the film. We isolate the screw and edge components of the individual dislocations and show how they result in weak charge heterogeneities via flexoelectric coupling. We show that even systems with small lattice mismatches and additional mechanisms of stress relief (such as mechanical twinning) may still give rise to measurable charge and strain heterogeneities that extend over mesoscopic length scales. This sets more stringent physical limitations on device size, dislocation density and the achievable degree of lattice mismatch in epitaxial systems.
Original languageEnglish
JournalNano letters
Volume19
Issue number3
Pages (from-to)1445-1450
Number of pages6
ISSN1530-6984
DOIs
Publication statusPublished - 2019

Keywords

  • Ferroelectric
  • Dislocation
  • BiFeO3
  • Strain
  • Microscopy
  • Diffraction

Cite this

Simons, Hugh ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Pantleon, Wolfgang ; Chu, Ying-Hao ; Detlefs, Carsten ; Valanoor, Nagarajan. / Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide. In: Nano letters. 2019 ; Vol. 19, No. 3. pp. 1445-1450.
@article{e5201be2c53a42708b93d29049694092,
title = "Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide",
abstract = "The misfit dislocations formed at heteroepitaxial interfaces create long-ranging strain fields in addition to the epitaxial strain. For systems with strong lattice coupling, such as ferroic oxides, this results in unpredictable and potentially debilitating functionality and device performance. In this work, we use dark-field x-ray microscopy to map the lattice distortions around misfit dislocations in an epitaxial film of bismuth ferrite (BiFeO3) - a well-known multiferroic. We demonstrate the ability to precisely quantify weak, long-ranging strain fields and their associated symmetry lowering without modifying the mechanical state of the film. We isolate the screw and edge components of the individual dislocations and show how they result in weak charge heterogeneities via flexoelectric coupling. We show that even systems with small lattice mismatches and additional mechanisms of stress relief (such as mechanical twinning) may still give rise to measurable charge and strain heterogeneities that extend over mesoscopic length scales. This sets more stringent physical limitations on device size, dislocation density and the achievable degree of lattice mismatch in epitaxial systems.",
keywords = "Ferroelectric, Dislocation, BiFeO3, Strain, Microscopy, Diffraction",
author = "Hugh Simons and Jakobsen, {Anders Clemen} and Ahl, {Sonja Rosenlund} and Poulsen, {Henning Friis} and Wolfgang Pantleon and Ying-Hao Chu and Carsten Detlefs and Nagarajan Valanoor",
year = "2019",
doi = "10.1021/acs.nanolett.8b03839",
language = "English",
volume = "19",
pages = "1445--1450",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "3",

}

Simons, H, Jakobsen, AC, Ahl, SR, Poulsen, HF, Pantleon, W, Chu, Y-H, Detlefs, C & Valanoor, N 2019, 'Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide', Nano letters, vol. 19, no. 3, pp. 1445-1450. https://doi.org/10.1021/acs.nanolett.8b03839

Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide. / Simons, Hugh; Jakobsen, Anders Clemen; Ahl, Sonja Rosenlund; Poulsen, Henning Friis; Pantleon, Wolfgang; Chu, Ying-Hao; Detlefs, Carsten; Valanoor, Nagarajan.

In: Nano letters, Vol. 19, No. 3, 2019, p. 1445-1450.

Research output: Contribution to journal › Journal article › Research › peer-review

TY - JOUR

T1 - Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide

AU - Simons, Hugh

AU - Jakobsen, Anders Clemen

AU - Ahl, Sonja Rosenlund

AU - Poulsen, Henning Friis

AU - Pantleon, Wolfgang

AU - Chu, Ying-Hao

AU - Detlefs, Carsten

AU - Valanoor, Nagarajan

PY - 2019

Y1 - 2019

N2 - The misfit dislocations formed at heteroepitaxial interfaces create long-ranging strain fields in addition to the epitaxial strain. For systems with strong lattice coupling, such as ferroic oxides, this results in unpredictable and potentially debilitating functionality and device performance. In this work, we use dark-field x-ray microscopy to map the lattice distortions around misfit dislocations in an epitaxial film of bismuth ferrite (BiFeO3) - a well-known multiferroic. We demonstrate the ability to precisely quantify weak, long-ranging strain fields and their associated symmetry lowering without modifying the mechanical state of the film. We isolate the screw and edge components of the individual dislocations and show how they result in weak charge heterogeneities via flexoelectric coupling. We show that even systems with small lattice mismatches and additional mechanisms of stress relief (such as mechanical twinning) may still give rise to measurable charge and strain heterogeneities that extend over mesoscopic length scales. This sets more stringent physical limitations on device size, dislocation density and the achievable degree of lattice mismatch in epitaxial systems.

AB - The misfit dislocations formed at heteroepitaxial interfaces create long-ranging strain fields in addition to the epitaxial strain. For systems with strong lattice coupling, such as ferroic oxides, this results in unpredictable and potentially debilitating functionality and device performance. In this work, we use dark-field x-ray microscopy to map the lattice distortions around misfit dislocations in an epitaxial film of bismuth ferrite (BiFeO3) - a well-known multiferroic. We demonstrate the ability to precisely quantify weak, long-ranging strain fields and their associated symmetry lowering without modifying the mechanical state of the film. We isolate the screw and edge components of the individual dislocations and show how they result in weak charge heterogeneities via flexoelectric coupling. We show that even systems with small lattice mismatches and additional mechanisms of stress relief (such as mechanical twinning) may still give rise to measurable charge and strain heterogeneities that extend over mesoscopic length scales. This sets more stringent physical limitations on device size, dislocation density and the achievable degree of lattice mismatch in epitaxial systems.

KW - Ferroelectric

KW - Dislocation

KW - BiFeO3

KW - Strain

KW - Microscopy

KW - Diffraction

U2 - 10.1021/acs.nanolett.8b03839

DO - 10.1021/acs.nanolett.8b03839

M3 - Journal article

VL - 19

SP - 1445

EP - 1450

JO - Nano Letters

JF - Nano Letters

SN - 1530-6984

IS - 3

ER -

Simons H, Jakobsen AC, Ahl SR, Poulsen HF, Pantleon W, Chu Y-H et al. Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide. Nano letters. 2019;19(3):1445-1450. https://doi.org/10.1021/acs.nanolett.8b03839

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