Non-Contact Paper Thickness and Quality Monitoring Based on Mid-Infrared Optical Coherence Tomography and THz Time Domain Spectroscopy

Rasmus Eilkær Hansen, Thorsten Bæk, Simon Lehnskov Lange, Niels Møller Israelsen, Markku Mäntylä, Ole Bang, Christian Rosenberg Petersen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

In industrial paper production, online monitoring of a range of quality parameters is essential for ensuring that the performance and appearance of the final product is suitable for a given application. In this article, two optical sensing techniques are investigated for non-destructive, non-contact characterization of paper thickness, surface roughness, and production defects. The first technique is optical coherence tomography based on a mid-infrared supercontinuum laser, which can cover thicknesses from ~20–90 µm and provide information about the surface finish. Detection of subsurface voids, cuts, and oil contamination was also demonstrated. The second technique is terahertz time domain spectroscopy, which is used to measure paper thicknesses of up to 443 µm. A proof-of-concept thickness measurement in freely suspended paper was also demonstrated. These demonstrations highlight the added functionality and potential of tomographic optical sensing methods towards industrial non-contact quality monitoring.

Original languageEnglish
Article number1549
JournalSensors
Volume22
Issue number4
Number of pages14
ISSN1424-8220
DOIs
Publication statusPublished - 1 Feb 2022

Keywords

  • Defect
  • Imaging
  • Mid-infrared
  • NDT
  • Non-contact
  • Non-destructive
  • OCT
  • TDS
  • Thickness
  • THz

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