NiO/YSZ Reduction for SOFC/SOEC Studied In Situ by Environmental Transmission Electron Microscopy

Keyphrases

• In Situ 100%
• Environmental Scanning Electron Microscopy 100%
• NiO-YSZ 100%
• Environmental TEM 57%
• Atomic Scale 28%
• Room Temperature 28%
• Averaging Method 28%
• Image Series 28%
• Temperature Ramping 28%
• X-ray 14%
• Thermogravimetric Analysis 14%
• Transmission Electron Microscopy 14%
• Ceramic Materials 14%
• Nanoscale Structure 14%
• Reduction Method 14%
• Elevated Temperature 14%
• Inhibiting Effect 14%
• Scale Resolution 14%
• TEM Images 14%
• In Situ Experiment 14%
• Nickel Oxide 14%
• Direct Interaction 14%
• Nickel Surfaces 14%
• Heating Holder 14%
• ECell 14%
• Ramp Rate 14%
• Gas Environment 14%
• Reactive Gas 14%
• Y2O3 Stabilized ZrO2 14%
• Porous Ni 14%
• NiO Reduction 14%
• Full Reduction 14%
• Fine Powder 14%
• Ceramic Nanomaterials 14%
• Reduction Preparation 14%
• Temperature Dependence 14%
• Chip-based 14%
• Scanning Electron Microscopy (SEM-EDS) 14%
• Titan 14%
• Nano-scaled 14%
• Diffraction Analysis 14%
• Rapid Process 14%

Material Science

• Scanning Electron Microscopy 100%
• Anode 100%
• Cathode 100%
• Transmission Electron Microscopy 100%
• Nanostructure 50%
• X Ray Diffraction Analysis 50%
• Zirconia 50%
• Ceramic Material 50%
• Thermogravimetric Analysis 50%
• Oxide Compound 50%
• Elevated Temperature 50%