Nickel Oxide Reduction Studied by Environmental TEM and in situ XRD

Q. Jeangros, Thomas Willum Hansen, Jakob Birkedal Wagner, Christian Danvad Damsgaard, R.E. Dunin-Borkowski, C. Hébert, J. Van herle, A. Hessler-Wyser

    Research output: Contribution to journalConference abstract in journalResearchpeer-review

    Original languageEnglish
    JournalMicroscopy and Microanalysis
    Volume18
    Issue numberSupplement 2
    Pages (from-to)1176-1177
    ISSN1431-9276
    DOIs
    Publication statusPublished - 2012
    Event Microscopy and Microanalysis 2012 Meeting - Phoenix Convention Center, Phoenix, AZ, United States
    Duration: 29 Jul 20122 Aug 2012
    http://www.microscopy.org/MandM/2012/index.cfm

    Conference

    Conference Microscopy and Microanalysis 2012 Meeting
    LocationPhoenix Convention Center
    CountryUnited States
    CityPhoenix, AZ
    Period29/07/201202/08/2012
    Internet address

    Bibliographical note

    Poster presentation at the conference

    Cite this

    Jeangros, Q., Hansen, T. W., Wagner, J. B., Damsgaard, C. D., Dunin-Borkowski, R. E., Hébert, C., Van herle, J., & Hessler-Wyser, A. (2012). Nickel Oxide Reduction Studied by Environmental TEM and in situ XRD. Microscopy and Microanalysis, 18(Supplement 2), 1176-1177. https://doi.org/10.1017/S1431927612007738