New understanding of static recrystallization from phase-field simulations

Phase-field (PF) simulations have emerged as a powerful tool for understanding recrystallization phenomena. While numerous factors could simultaneously influence the recrystallization processes of deformed microstructures in experiments, PF simulations allow one to isolate the contribution of each factor and mesoscale mechanism to the overall recrystallization microstructure development and thus determine their relative importance. Furthermore, there are always irregularities in the deformation microstructures, complicating the analysis of experimental results. This article highlights the new understandings of boundary migration during static recrystallization achieved through a close integration of experiments and PF simulations. Finally, we briefly discuss the potential application of PF simulations to probe the dynamics of recrystallization. Graphical abstract: (Figure presented.)