New method of silicon photovoltaic panel fault detection using impedance spectroscopy

The aim of our project is to develop a new method for photovoltaic (PV) panel fault detection based on analysing its impedance spectra (IS). Although this technique was successful in assessing the state of degradation of fuel cells and batteries [1, 2], it has never been applied to PV cells on a wide scale. In this paper, we show that, unlike current-voltage (I-V) tests, the IS method is capable of early detection of changes in PV panel parameters due to microcracks and potential-induced degradation (PID). Although our measurements are only successful under dark conditions, the results are similar for both laboratory environment and for outdoor tests in various weather conditions. A fully developed IS technique, accounting for all kinds of most common PV panel degradation types, would surpass the existing PV fault detection methods then it comes to cost and accuracy [3,4].