New Details About the Frequency Behavior of Irradiated Bipolar Operational Amplifiers

F.J. Franco, Yi Zong, J.A. Agapito

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The frequency behavior of a bipolar operational amplifier (op amp) is always expected to worsen when the device is irradiated. In other words, parameters like the slew rate and the gain-bandwidth product are to decrease after either neutron or gamma tests. However, some neutron and TID tests performed on a large variety of bipolar op amps have shown that the evolution of the frequency behavior is not as simple as it is usually believed. In fact, there is evidence of an increasing influence of the power
supply values on the former parameters, which can be extremely important in some devices. Also, the relationship among different frequency parameters has been investigated and, finally, an interesting and scarcely reported phenomenon is depicted. This phenomenon is the appearance of spontaneous oscillations in fed-back op amps, without doubt related to the modification of the gain and phase margins of the devices.
Original languageEnglish
JournalI E E E Transactions on Nuclear Science
Volume53
Issue number4
Pages (from-to)1931-1938
ISSN0018-9499
DOIs
Publication statusPublished - 2006
Externally publishedYes

Cite this

@article{7e2338a7ed9545c1b03589249cc60db1,
title = "New Details About the Frequency Behavior of Irradiated Bipolar Operational Amplifiers",
abstract = "The frequency behavior of a bipolar operational amplifier (op amp) is always expected to worsen when the device is irradiated. In other words, parameters like the slew rate and the gain-bandwidth product are to decrease after either neutron or gamma tests. However, some neutron and TID tests performed on a large variety of bipolar op amps have shown that the evolution of the frequency behavior is not as simple as it is usually believed. In fact, there is evidence of an increasing influence of the powersupply values on the former parameters, which can be extremely important in some devices. Also, the relationship among different frequency parameters has been investigated and, finally, an interesting and scarcely reported phenomenon is depicted. This phenomenon is the appearance of spontaneous oscillations in fed-back op amps, without doubt related to the modification of the gain and phase margins of the devices.",
author = "F.J. Franco and Yi Zong and J.A. Agapito",
year = "2006",
doi = "10.1109/TNS.2006.880948",
language = "English",
volume = "53",
pages = "1931--1938",
journal = "I E E E Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers",
number = "4",

}

New Details About the Frequency Behavior of Irradiated Bipolar Operational Amplifiers. / Franco, F.J.; Zong, Yi; Agapito, J.A.

In: I E E E Transactions on Nuclear Science, Vol. 53, No. 4, 2006, p. 1931-1938.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - New Details About the Frequency Behavior of Irradiated Bipolar Operational Amplifiers

AU - Franco, F.J.

AU - Zong, Yi

AU - Agapito, J.A.

PY - 2006

Y1 - 2006

N2 - The frequency behavior of a bipolar operational amplifier (op amp) is always expected to worsen when the device is irradiated. In other words, parameters like the slew rate and the gain-bandwidth product are to decrease after either neutron or gamma tests. However, some neutron and TID tests performed on a large variety of bipolar op amps have shown that the evolution of the frequency behavior is not as simple as it is usually believed. In fact, there is evidence of an increasing influence of the powersupply values on the former parameters, which can be extremely important in some devices. Also, the relationship among different frequency parameters has been investigated and, finally, an interesting and scarcely reported phenomenon is depicted. This phenomenon is the appearance of spontaneous oscillations in fed-back op amps, without doubt related to the modification of the gain and phase margins of the devices.

AB - The frequency behavior of a bipolar operational amplifier (op amp) is always expected to worsen when the device is irradiated. In other words, parameters like the slew rate and the gain-bandwidth product are to decrease after either neutron or gamma tests. However, some neutron and TID tests performed on a large variety of bipolar op amps have shown that the evolution of the frequency behavior is not as simple as it is usually believed. In fact, there is evidence of an increasing influence of the powersupply values on the former parameters, which can be extremely important in some devices. Also, the relationship among different frequency parameters has been investigated and, finally, an interesting and scarcely reported phenomenon is depicted. This phenomenon is the appearance of spontaneous oscillations in fed-back op amps, without doubt related to the modification of the gain and phase margins of the devices.

U2 - 10.1109/TNS.2006.880948

DO - 10.1109/TNS.2006.880948

M3 - Journal article

VL - 53

SP - 1931

EP - 1938

JO - I E E E Transactions on Nuclear Science

JF - I E E E Transactions on Nuclear Science

SN - 0018-9499

IS - 4

ER -