Abstract
Dephasing processes in the optical transitions in low-dimensional semiconductor nanostructures are studied by a novel technique involving a speckle analysis of the secondary emission after a short-pulse resonant excitation. The results are compared with more conventional transient four-wave mixing experiments. A special heterodyne detection technique has made it possible to perform the latter on self-assembled semiconductor quantum dots embedded in a semiconductor optical amplifier.
| Original language | English |
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| Title of host publication | Proceedings of the16th Course of the International School of Atomic and Molecular Spectroscopy |
| Editors | Kashawna Harling, Xuesheng Chen |
| Publisher | International School of Atomic and Molecular Spectroscopy |
| Publication date | 1999 |
| Pages | 307-327 |
| ISBN (Print) | 98-10-24728-1 |
| Publication status | Published - 1999 |
| Event | 16th course International School of Atomic and Molecular Spectroscopy - Erice, Italy Duration: 17 Jun 1999 → 1 Jul 1999 Conference number: 16 |
Course
| Course | 16th course International School of Atomic and Molecular Spectroscopy |
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| Number | 16 |
| Country/Territory | Italy |
| City | Erice |
| Period | 17/06/1999 → 01/07/1999 |