New Applications of Ultrafast Spectroscopy

Jørn Märcher Hvam (Invited author)

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

Abstract

Dephasing processes in the optical transitions in low-dimensional semiconductor nanostructures are studied by a novel technique involving a speckle analysis of the secondary emission after a short-pulse resonant excitation. The results are compared with more conventional transient four-wave mixing experiments. A special heterodyne detection technique has made it possible to perform the latter on self-assembled semiconductor quantum dots embedded in a semiconductor optical amplifier.
Original languageEnglish
Title of host publicationProceedings of the16th Course of the International School of Atomic and Molecular Spectroscopy
EditorsKashawna Harling, Xuesheng Chen
PublisherInternational School of Atomic and Molecular Spectroscopy
Publication date1999
Pages307-327
ISBN (Print)98-10-24728-1
Publication statusPublished - 1999
Event16th course International School of Atomic and Molecular Spectroscopy - Erice, Italy
Duration: 17 Jun 19991 Jul 1999
Conference number: 16

Course

Course16th course International School of Atomic and Molecular Spectroscopy
Number16
CountryItaly
CityErice
Period17/06/199901/07/1999

Cite this

Hvam, J. M. (1999). New Applications of Ultrafast Spectroscopy. In K. Harling, & X. Chen (Eds.), Proceedings of the16th Course of the International School of Atomic and Molecular Spectroscopy (pp. 307-327). International School of Atomic and Molecular Spectroscopy.