New algorithms for worst case tolerance optimization

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 1978 IEEE International Symposium on Circuits and Systems
Publication date	1978
Pages	681-685
Publication status	Published - 1978
Event	1978 IEEE International Symposium on Circuits and Systems - New York, United States Duration: 16 May 1978 → 18 May 1978

Conference	1978 IEEE International Symposium on Circuits and Systems
Country/Territory	United States
City	New York
Period	16/05/1978 → 18/05/1978

OpenUrl availability

@inproceedings{c3867ec2eb5c4982b73c28d9ff7a191b,

title = "New algorithms for worst case tolerance optimization",

author = "Kaj Madsen and Hans Schj{\ae}r-Jacobsen",

year = "1978",

language = "English",

pages = "681--685",

booktitle = "Proceedings of the 1978 IEEE International Symposium on Circuits and Systems",

note = "1978 IEEE International Symposium on Circuits and Systems ; Conference date: 16-05-1978 Through 18-05-1978",

}