New algorithms for worst case tolerance optimization

Kaj Madsen, Hans Schjær-Jacobsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 1978 IEEE International Symposium on Circuits and Systems
    Publication date1978
    Pages681-685
    Publication statusPublished - 1978
    Event1978 IEEE International Symposium on Circuits and Systems - New York, United States
    Duration: 16 May 197818 May 1978

    Conference

    Conference1978 IEEE International Symposium on Circuits and Systems
    CountryUnited States
    CityNew York
    Period16/05/197818/05/1978

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