Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude

J. Olsen; P.E. Becher; P.B. Fynbo; P. Raaby; J. Schultz

doi:10.1109/23.212319

Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude

J. Olsen
, P.E. Becher
, P.B. Fynbo
, P. Raaby
, J. Schultz

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Observations of 14 neutron-induced single event upsets (SEUs) in static memory devices (SRAMs) at commercial aircraft flight altitudes are described. The observed SEU rate at a 10 km flight altitude based on an exposure of 160 standard 256 kb CMOS SRAMs is 4.8*10/sup -8/ upsets/b/day. In the laboratory, 117 SRAMs of two different brands were irradiated with fast neutrons from a Pu-Be source. A total of 176 SEUs have been observed, including two SEU pairs. The upset rates from the laboratory tests are compared to those found in the airborne SRAMs

Original language	English
Journal	I E E E Transactions on Nuclear Science
Volume	40
Issue number	2
Pages (from-to)	74-77
ISSN	0018-9499
DOIs	https://doi.org/10.1109/23.212319
Publication status	Published - 1993

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title = "Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude",

abstract = "Observations of 14 neutron-induced single event upsets (SEUs) in static memory devices (SRAMs) at commercial aircraft flight altitudes are described. The observed SEU rate at a 10 km flight altitude based on an exposure of 160 standard 256 kb CMOS SRAMs is 4.8*10/sup -8/ upsets/b/day. In the laboratory, 117 SRAMs of two different brands were irradiated with fast neutrons from a Pu-Be source. A total of 176 SEUs have been observed, including two SEU pairs. The upset rates from the laboratory tests are compared to those found in the airborne SRAMs",

keywords = "Nuklear sikkerhed og str{\aa}lingsbeskyttelse",

author = "J. Olsen and P.E. Becher and P.B. Fynbo and P. Raaby and J. Schultz",

year = "1993",

doi = "10.1109/23.212319",

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volume = "40",

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journal = "I E E E Transactions on Nuclear Science",

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TY - JOUR

T1 - Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude

AU - Olsen, J.

AU - Becher, P.E.

AU - Fynbo, P.B.

AU - Raaby, P.

AU - Schultz, J.

PY - 1993

Y1 - 1993

N2 - Observations of 14 neutron-induced single event upsets (SEUs) in static memory devices (SRAMs) at commercial aircraft flight altitudes are described. The observed SEU rate at a 10 km flight altitude based on an exposure of 160 standard 256 kb CMOS SRAMs is 4.8*10/sup -8/ upsets/b/day. In the laboratory, 117 SRAMs of two different brands were irradiated with fast neutrons from a Pu-Be source. A total of 176 SEUs have been observed, including two SEU pairs. The upset rates from the laboratory tests are compared to those found in the airborne SRAMs

AB - Observations of 14 neutron-induced single event upsets (SEUs) in static memory devices (SRAMs) at commercial aircraft flight altitudes are described. The observed SEU rate at a 10 km flight altitude based on an exposure of 160 standard 256 kb CMOS SRAMs is 4.8*10/sup -8/ upsets/b/day. In the laboratory, 117 SRAMs of two different brands were irradiated with fast neutrons from a Pu-Be source. A total of 176 SEUs have been observed, including two SEU pairs. The upset rates from the laboratory tests are compared to those found in the airborne SRAMs

KW - Nuklear sikkerhed og strålingsbeskyttelse

U2 - 10.1109/23.212319

DO - 10.1109/23.212319

M3 - Journal article

SN - 0018-9499

VL - 40

SP - 74

EP - 77

JO - I E E E Transactions on Nuclear Science

JF - I E E E Transactions on Nuclear Science

IS - 2

ER -

Neutron-induced single event upsets in static RAMS observed at 10 KM flight altitude

Abstract

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