Negative Ion Detection by Developing their Flux Profile to a Biased Target

Eugen Stamate, K. Ohe, H. Sugai

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of 23rd International Symposium on Dry Process (DPS)
Number of pages4
Publication date2001
Pages75-79
Publication statusPublished - 2001
Externally publishedYes
Event23rd International Symposium on Dry Process - Tokyo, Japan
Duration: 20 Nov 200121 Nov 2001

Conference

Conference23rd International Symposium on Dry Process
Country/TerritoryJapan
CityTokyo
Period20/11/200121/11/2001

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