Negative Ion Detection by Developing their Flux Profile to a Biased Target

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Proceedings of 23rd International Symposium on Dry Process (DPS)
Number of pages	4
Publication date	2001
Pages	75-79
Publication status	Published - 2001
Externally published	Yes
Event	23rd International Symposium on Dry Process - Tokyo, Japan Duration: 20 Nov 2001 → 21 Nov 2001 Conference number: 23

Conference	23rd International Symposium on Dry Process
Number	23
Country/Territory	Japan
City	Tokyo
Period	20/11/2001 → 21/11/2001

OpenUrl availability

@inproceedings{d9ef945192b84fa287a211d0b49e6615,

title = "Negative Ion Detection by Developing their Flux Profile to a Biased Target",

author = "Eugen Stamate and K. Ohe and H. Sugai",

year = "2001",

language = "English",

pages = "75--79",

booktitle = "Proceedings of 23rd International Symposium on Dry Process (DPS)",

note = "23rd International Symposium on Dry Process ; Conference date: 20-11-2001 Through 21-11-2001",

}

TY - GEN

T1 - Negative Ion Detection by Developing their Flux Profile to a Biased Target

AU - Stamate, Eugen

AU - Ohe, K.

AU - Sugai, H.

N1 - Conference code: 23

PY - 2001

Y1 - 2001

M3 - Article in proceedings

SP - 75

EP - 79

BT - Proceedings of 23rd International Symposium on Dry Process (DPS)

T2 - 23rd International Symposium on Dry Process

Y2 - 20 November 2001 through 21 November 2001

ER -