Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films

Research output: Contribution to journalJournal article – Annual report year: 2018Researchpeer-review

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The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
Original languageEnglish
JournalPhysical Chemistry Chemical Physics
Volume20
Issue number41
Pages (from-to)26068-26071
ISSN1463-9076
DOIs
Publication statusPublished - 2018
CitationsWeb of Science® Times Cited: No match on DOI
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