Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films

Mohsin Raza, Simone Sanna, Lucia Dos Santos Gómez, Eric Gautron, Abdel Aziz El Mel, Nini Pryds, Rony Snyders, Stéphanos Konstantinidis, Vincenzo Esposito*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
Original languageEnglish
JournalPhysical Chemistry Chemical Physics
Volume20
Issue number41
Pages (from-to)26068-26071
ISSN1463-9076
DOIs
Publication statusPublished - 2018

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