Abstract
The cubic phase of pure zirconia (ZrO2) is stabilized in dense thin films through a controlled introduction of oxygen vacancies (O defects) by cold-plasma-based sputtering deposition. Here, we show that the cubic crystals present at the film/substrate interface near-region exhibit fast ionic transport, which is superior to what is obtained with similar yttrium-stabilized cubic zirconia thin films.
Original language | English |
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Journal | Physical Chemistry Chemical Physics |
Volume | 20 |
Issue number | 41 |
Pages (from-to) | 26068-26071 |
ISSN | 1463-9076 |
DOIs | |
Publication status | Published - 2018 |