Near-field optical microscopy of localized excitations on rough surfaces: influence of a probe

Sergey I. Bozhevolnyi

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    Starting from the general principles of near-field optical microscopy. I consider the influence of a probe when being used to image localized dipolar excitations and suggest a way of evaluating the perturbation thus introduced. Using the rigorous microscopic (electric) point-dipole description, I calculate the self consistent field intensity at the site of a probe dipole scanning over resonantly interacting object dipoles and show that the intensity distribution deviates from that existing in the absence of a probe. I demonstrate that this difference increases with an increase in the polarizability of the probe dipole, resulting eventually in a completely different intensity distribution, The calculations also show that the perturbation of the intensity distribution due to the presence of a probe decreases with an increase in the probe-sample distance. In order to evaluate the degree of perturbation, I suggest comparing the images obtained at different probe-sample distances, Finally I formulate a simple rule of thumb that allows one to roughly estimate the probe-sample coupling when imaging localized elicitations.
    Original languageEnglish
    JournalJournal of Microscopy
    Volume194
    Issue number2-3
    Pages (from-to)561-566
    ISSN0022-2720
    DOIs
    Publication statusPublished - 1999
    Event5th International Conference on Near Field Optics and Related Techniques (NFO-5) - Shirohama, Japan
    Duration: 6 Dec 199810 Dec 1998
    Conference number: 5

    Conference

    Conference5th International Conference on Near Field Optics and Related Techniques (NFO-5)
    Number5
    Country/TerritoryJapan
    CityShirohama
    Period06/12/199810/12/1998

    Keywords

    • Multiple scattering
    • Near-field optics
    • Probe-sample interaction
    • Scanning near-field optical microscopy

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