Abstract
Starting from the general principles of near-field optical microscopy. I consider the influence of a probe when being used to image localized dipolar excitations and suggest a way of evaluating the perturbation thus introduced. Using the rigorous microscopic (electric) point-dipole description, I calculate the self consistent field intensity at the site of a probe dipole scanning over resonantly interacting object dipoles and show that the intensity distribution deviates from that existing in the absence of a probe. I demonstrate that this difference increases with an increase in the polarizability of the probe dipole, resulting eventually in a completely different intensity distribution, The calculations also show that the perturbation of the intensity distribution due to the presence of a probe decreases with an increase in the probe-sample distance. In order to evaluate the degree of perturbation, I suggest comparing the images obtained at different probe-sample distances, Finally I formulate a simple rule of thumb that allows one to roughly estimate the probe-sample coupling when imaging localized elicitations.
Original language | English |
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Journal | Journal of Microscopy |
Volume | 194 |
Issue number | 2-3 |
Pages (from-to) | 561-566 |
ISSN | 0022-2720 |
DOIs | |
Publication status | Published - 1999 |
Event | 5th International Conference on Near Field Optics and Related Techniques (NFO-5) - Shirohama, Japan Duration: 6 Dec 1998 → 10 Dec 1998 Conference number: 5 |
Conference
Conference | 5th International Conference on Near Field Optics and Related Techniques (NFO-5) |
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Number | 5 |
Country/Territory | Japan |
City | Shirohama |
Period | 06/12/1998 → 10/12/1998 |
Keywords
- Multiple scattering
- Near-field optics
- Probe-sample interaction
- Scanning near-field optical microscopy