Near-Field Optical Microscopy of Fractal Structures

Victor Coello, Sergey I. Bozhevolnyi

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Using a photon scanning tunnelling microscope combined with a shear-force feedback system, we image both topographical and near-field optical images (at the wavelengths of 633 and 594 nm) of silver colloid fractals. Near-field optical imaging is calibrated with a standing evanescent wave pattern. Near-field optical images exhibit spatially localized (within 150-250 nm) intensity enhancement (by up to 20 times) in the form of round bright spots, whose positions and brightness are found to be sensitive to the light wavelength, polarization and angle of incidence. The observed phenomenon is related to the localization of resonant dipolar eigenmodes in random surface nanostructures.
Original languageEnglish
JournalNanotechnology
Volume10
Issue number1
Pages (from-to)108-112
ISSN0957-4484
Publication statusPublished - 1999

Cite this