Near-field characterization of photonic crystal Y-splitters

V. S. Volkov, S. I. Bozhevolnyi, Peter Ingo Borel, Lars Hagedorn Frandsen, Martin Kristensen

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A scanning near-field optical microscope (SNOM) is used to directly map the propagation of light in a specially designed 50/50 photonic crystal (PC) Y-splitter fabricated on silicon-on-insulator (SOI) wafers. SNOM images are obtained for TE- and TM-polarized light in the wavelength range 1425-1570 nm. The recorded intensity distribution exhibit highly wavelength (and polarization) dependent intensity variations along the propagation direction, especially around the fork and bend regions. By comparing the SNOM images recorded in and after the PC Y-splitter area, the features of light distribution are analyzed for both polarizations.
Original languageEnglish
JournalPhysica Status Solidi. C: Current Topics in Solid State Physics
Volume2
Issue number12
Pages (from-to)4087-4092
ISSN1862-6351
DOIs
Publication statusPublished - 2005

Cite this

Volkov, V. S., Bozhevolnyi, S. I., Borel, P. I., Frandsen, L. H., & Kristensen, M. (2005). Near-field characterization of photonic crystal Y-splitters. Physica Status Solidi. C: Current Topics in Solid State Physics, 2(12), 4087-4092. https://doi.org/10.1002/pssc.200562224