TY - JOUR
T1 - Nanostructure of organic semiconductor thin films: Molecular dynamics modeling with solvent evaporation
AU - Gertsen, Anders Skovbo
AU - Sørensen, Michael Korning
AU - Andreasen, Jens Wenzel
PY - 2020
Y1 - 2020
N2 - We present a procedure for simulating solution deposition of organic thin-films on explicitly modeled substrates via solvent evaporation simulations in a molecular dynamics framework. Additionally, we have developed force fields for the family of IDTBR nonfullerene acceptors, which have been widely employed in the literature as n-type materials in several types of organic semiconductor devices, and we analyzed their structure-property relationships using a combination of grazing incidence x-ray scattering measurements, atomistic molecular dynamics simulations, and quantum chemical calculations.We find that thermal fluctuations can have a significant impact on calculated electron transfer integrals, and that the π-stacking interactions of the electron withdrawing benzothiadiazole building blocks are key to high electron coupling in amorphous thin films of n-type materials.
AB - We present a procedure for simulating solution deposition of organic thin-films on explicitly modeled substrates via solvent evaporation simulations in a molecular dynamics framework. Additionally, we have developed force fields for the family of IDTBR nonfullerene acceptors, which have been widely employed in the literature as n-type materials in several types of organic semiconductor devices, and we analyzed their structure-property relationships using a combination of grazing incidence x-ray scattering measurements, atomistic molecular dynamics simulations, and quantum chemical calculations.We find that thermal fluctuations can have a significant impact on calculated electron transfer integrals, and that the π-stacking interactions of the electron withdrawing benzothiadiazole building blocks are key to high electron coupling in amorphous thin films of n-type materials.
UR - https://doi.org/10.11583/DTU.13507314.v1
UR - https://doi.org/10.11583/DTU.13507317.v1
U2 - 10.1103/PhysRevMaterials.4.075405
DO - 10.1103/PhysRevMaterials.4.075405
M3 - Journal article
SN - 2475-9953
VL - 4
JO - Physical Review Materials
JF - Physical Review Materials
IS - 7
M1 - 075405
ER -